Resistive switching in nanostructured thin films

H. Silva; H.L. Gomes; Y.G. Pogorelov; P. Stallinga; D.M. Leeuw, de; J.P. Araujo; J.B. Sousa; S.C.J. Meskers; G. Kakazei; S. Cardoso; P.P. Freitas

doi:10.1063/1.3134484

Resistive switching in nanostructured thin films

H. Silva, H.L. Gomes, Y.G. Pogorelov, P. Stallinga, D.M. Leeuw, de, J.P. Araujo, J.B. Sousa, S.C.J. Meskers, G. Kakazei, S. Cardoso, P.P. Freitas

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Abstract

Planar capacitor structures based on granular films composed of nanometric ferromagnetic grains embedded in an insulating Al2O3 matrix can switch between a high-conductance and a low-conductance state. The switching properties are induced by a forming process. The ON/OFF resistance ratio is as high as 104 under an electrical field of only 15 kV/m. This resistive switching is accompanied by a capacitive switching between two well-defined voltage-independent states, a behavior that is not readily explained by the filamentary type of conduction.

Original language	English
Article number	202107
Pages (from-to)	202107-1/3
Journal	Applied Physics Letters
Volume	94
Issue number	20
DOIs	https://doi.org/10.1063/1.3134484
Publication status	Published - 2009

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abstract = "Planar capacitor structures based on granular films composed of nanometric ferromagnetic grains embedded in an insulating Al2O3 matrix can switch between a high-conductance and a low-conductance state. The switching properties are induced by a forming process. The ON/OFF resistance ratio is as high as 104 under an electrical field of only 15 kV/m. This resistive switching is accompanied by a capacitive switching between two well-defined voltage-independent states, a behavior that is not readily explained by the filamentary type of conduction.",

author = "H. Silva and H.L. Gomes and Y.G. Pogorelov and P. Stallinga and {Leeuw, de}, D.M. and J.P. Araujo and J.B. Sousa and S.C.J. Meskers and G. Kakazei and S. Cardoso and P.P. Freitas",

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AU - Silva, H.

AU - Gomes, H.L.

AU - Pogorelov, Y.G.

AU - Stallinga, P.

AU - Leeuw, de, D.M.

AU - Araujo, J.P.

AU - Sousa, J.B.

AU - Meskers, S.C.J.

AU - Kakazei, G.

AU - Cardoso, S.

AU - Freitas, P.P.

PY - 2009

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N2 - Planar capacitor structures based on granular films composed of nanometric ferromagnetic grains embedded in an insulating Al2O3 matrix can switch between a high-conductance and a low-conductance state. The switching properties are induced by a forming process. The ON/OFF resistance ratio is as high as 104 under an electrical field of only 15 kV/m. This resistive switching is accompanied by a capacitive switching between two well-defined voltage-independent states, a behavior that is not readily explained by the filamentary type of conduction.

AB - Planar capacitor structures based on granular films composed of nanometric ferromagnetic grains embedded in an insulating Al2O3 matrix can switch between a high-conductance and a low-conductance state. The switching properties are induced by a forming process. The ON/OFF resistance ratio is as high as 104 under an electrical field of only 15 kV/m. This resistive switching is accompanied by a capacitive switching between two well-defined voltage-independent states, a behavior that is not readily explained by the filamentary type of conduction.

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DO - 10.1063/1.3134484

M3 - Article

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VL - 94

SP - 202107-1/3

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

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ER -

Resistive switching in nanostructured thin films

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