Resistance characterization for weak open defects

R.R. Montanes, J. Pineda de Gyvez, P.A.J. Volf

    Research output: Contribution to journalArticleAcademicpeer-review

    117 Citations (Scopus)
    312 Downloads (Pure)

    Abstract

    Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests
    Original languageEnglish
    Pages (from-to)18-26
    Number of pages9
    JournalIEEE Design and Test of Computers
    Volume19
    Issue number5
    DOIs
    Publication statusPublished - 2002

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