Resistance characterization for weak open defects

R.R. Montanes; J. Pineda de Gyvez; P.A.J. Volf

doi:10.1109/MDT.2002.1033788

Resistance characterization for weak open defects

R.R. Montanes, J. Pineda de Gyvez, P.A.J. Volf

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests

Original language	English
Pages (from-to)	18-26
Number of pages	9
Journal	IEEE Design and Test of Computers
Volume	19
Issue number	5
DOIs	https://doi.org/10.1109/MDT.2002.1033788
Publication status	Published - 2002

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title = "Resistance characterization for weak open defects",

abstract = "Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests",

author = "R.R. Montanes and {Pineda de Gyvez}, J. and P.A.J. Volf",

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AU - Pineda de Gyvez, J.

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N2 - Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests

AB - Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests

U2 - 10.1109/MDT.2002.1033788

DO - 10.1109/MDT.2002.1033788

M3 - Article

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EP - 26

JO - IEEE Design and Test of Computers

JF - IEEE Design and Test of Computers

IS - 5

ER -

Resistance characterization for weak open defects

Abstract

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