Reliable in-situ thickness monitoring of multilayer paints based on THz time domain spectroscopy

Andreas Frank; Deran J.H.C. Maas; J.L.M. van Mechelen

doi:10.1364/AIO.2019.W4A.2

Reliable in-situ thickness monitoring of multilayer paints based on THz time domain spectroscopy

Andreas Frank
, Deran J.H.C. Maas
, J.L.M. van Mechelen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

We present a femtosecond laser-based THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. Multiple layers can be measured simultaneously with an average error smaller than 1.1 µm.

Original language	English
Title of host publication	Applied Industrial Optics
Subtitle of host publication	Spectroscopy, Imaging and Metrology - Proceedings Applied Industrial Optics 2019
Publisher	Optical Society of America (OSA)
Number of pages	2
ISBN (Electronic)	978-1-943580-65-1
DOIs	https://doi.org/10.1364/AIO.2019.W4A.2
Publication status	Published - 1 Jul 2019
Externally published	Yes
Event	Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2019 - Washington, United States Duration: 8 Jul 2019 → 10 Jul 2019

Conference

Conference	Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2019
Country/Territory	United States
City	Washington
Period	8/07/19 → 10/07/19

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10.1364/AIO.2019.W4A.2

Cite this

@inproceedings{03abef48d7d6480681152c22bb6b8dcd,

title = "Reliable in-situ thickness monitoring of multilayer paints based on THz time domain spectroscopy",

abstract = "We present a femtosecond laser-based THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. Multiple layers can be measured simultaneously with an average error smaller than 1.1 µm.",

author = "Andreas Frank and Maas, \{Deran J.H.C.\} and \{van Mechelen\}, J.L.M.",

year = "2019",

month = jul,

day = "1",

doi = "10.1364/AIO.2019.W4A.2",

language = "English",

booktitle = "Applied Industrial Optics",

publisher = "Optical Society of America (OSA)",

address = "United States",

note = "Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2019 ; Conference date: 08-07-2019 Through 10-07-2019",

}

Frank, A, Maas, DJHC & van Mechelen, JLM 2019, Reliable in-situ thickness monitoring of multilayer paints based on THz time domain spectroscopy. in Applied Industrial Optics: Spectroscopy, Imaging and Metrology - Proceedings Applied Industrial Optics 2019., W4A.2, Optical Society of America (OSA), Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2019, Washington, United States, 8/07/19. https://doi.org/10.1364/AIO.2019.W4A.2

Reliable in-situ thickness monitoring of multilayer paints based on THz time domain spectroscopy. / Frank, Andreas; Maas, Deran J.H.C.; van Mechelen, J.L.M.
Applied Industrial Optics: Spectroscopy, Imaging and Metrology - Proceedings Applied Industrial Optics 2019. Optical Society of America (OSA), 2019. W4A.2.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Reliable in-situ thickness monitoring of multilayer paints based on THz time domain spectroscopy

AU - Frank, Andreas

AU - Maas, Deran J.H.C.

AU - van Mechelen, J.L.M.

PY - 2019/7/1

Y1 - 2019/7/1

N2 - We present a femtosecond laser-based THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. Multiple layers can be measured simultaneously with an average error smaller than 1.1 µm.

AB - We present a femtosecond laser-based THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. Multiple layers can be measured simultaneously with an average error smaller than 1.1 µm.

UR - https://www.scopus.com/pages/publications/85085660640

U2 - 10.1364/AIO.2019.W4A.2

DO - 10.1364/AIO.2019.W4A.2

M3 - Conference contribution

AN - SCOPUS:85085660640

BT - Applied Industrial Optics

PB - Optical Society of America (OSA)

T2 - Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2019

Y2 - 8 July 2019 through 10 July 2019

ER -

Reliable in-situ thickness monitoring of multilayer paints based on THz time domain spectroscopy

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