Reliable extraction of RF figures-of-merit for MOSFETs

E.P. Vandamme; D. Schreurs; B. Nauwelaers; C.H.J. Dinther, van; G. Badenes; L. Deferm

Reliable extraction of RF figures-of-merit for MOSFETs

E.P. Vandamme
, D. Schreurs
, B. Nauwelaers
, C.H.J. Dinther, van
, G. Badenes
, L. Deferm

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

1 Downloads (Pure)

Original language	English
Title of host publication	Proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium, 13 - 15 September 1999
Editors	H.E. Maes
Place of Publication	Paris
Publisher	Ed. Frontieres
Pages	660-663
ISBN (Print)	2-86332-245-1
Publication status	Published - 1999
Event	29th European Solid-State Device Research Conference (ESSDERC'99) - Leuven, Belgium Duration: 13 Sept 1999 → 15 Sept 1999

Conference

Conference	29th European Solid-State Device Research Conference (ESSDERC'99)
Abbreviated title	ESSDERC'99
Country/Territory	Belgium
City	Leuven
Period	13/09/99 → 15/09/99
Other

Cite this

@inproceedings{24562cabc2904a088157f2ee59228b08,

title = "Reliable extraction of RF figures-of-merit for MOSFETs",

author = "E.P. Vandamme and D. Schreurs and B. Nauwelaers and \{Dinther, van\}, C.H.J. and G. Badenes and L. Deferm",

year = "1999",

language = "English",

isbn = "2-86332-245-1",

pages = "660--663",

editor = "H.E. Maes",

booktitle = "Proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium, 13 - 15 September 1999",

publisher = "Ed. Frontieres",

note = "29th European Solid-State Device Research Conference (ESSDERC'99), ESSDERC'99 ; Conference date: 13-09-1999 Through 15-09-1999",

}

Vandamme, EP, Schreurs, D, Nauwelaers, B, Dinther, van, CHJ, Badenes, G & Deferm, L 1999, Reliable extraction of RF figures-of-merit for MOSFETs. in HE Maes (ed.), Proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium, 13 - 15 September 1999 . Ed. Frontieres, Paris, pp. 660-663, 29th European Solid-State Device Research Conference (ESSDERC'99), Leuven, Belgium, 13/09/99.

Reliable extraction of RF figures-of-merit for MOSFETs. / Vandamme, E.P.; Schreurs, D.; Nauwelaers, B. et al.
Proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium, 13 - 15 September 1999 . ed. / H.E. Maes. Paris: Ed. Frontieres, 1999. p. 660-663.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Reliable extraction of RF figures-of-merit for MOSFETs

AU - Vandamme, E.P.

AU - Schreurs, D.

AU - Nauwelaers, B.

AU - Dinther, van, C.H.J.

AU - Badenes, G.

AU - Deferm, L.

PY - 1999

Y1 - 1999

M3 - Conference contribution

SN - 2-86332-245-1

SP - 660

EP - 663

BT - Proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium, 13 - 15 September 1999

A2 - Maes, H.E.

PB - Ed. Frontieres

CY - Paris

T2 - 29th European Solid-State Device Research Conference (ESSDERC'99)

Y2 - 13 September 1999 through 15 September 1999

ER -