Reliable Design of Digital-to-Analog Converters using Pre-Correction and Embedded Self-Test

P.J.A. Harpe, J.M. Meulmeester, de, J.A. Hegt, A.H.M. Roermund, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publication11th IEEE International Mixed-Signals Testing Workshop
Publication statusPublished - 2005

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