Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles

W. Chang; A. Proebstl; D. Goswami; M. Zamani; S. Chakraborty

doi:10.1109/CPSNA.2015.16

Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles

W. Chang, A. Proebstl, D. Goswami, M. Zamani, S. Chakraborty

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

8 Citations (Scopus)

1 Downloads (Pure)

Abstract

Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.

Original language	English
Title of host publication	Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	37-42
Number of pages	6
ISBN (Electronic)	9781467377850
DOIs	https://doi.org/10.1109/CPSNA.2015.16
Publication status	Published - 18 Sept 2015
Event	3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015 - Hong Kong, China Duration: 19 Aug 2015 → 21 Aug 2015

Conference

Conference	3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015
Country/Territory	China
City	Hong Kong
Period	19/08/15 → 21/08/15

Keywords

battery aging
cyber-physical systems
quality of control
Semiconductor aging

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10.1109/CPSNA.2015.16

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Chang, W., Proebstl, A., Goswami, D., Zamani, M., & Chakraborty, S. (2015). Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles. In Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China (pp. 37-42). [7272682] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CPSNA.2015.16

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abstract = "Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.",

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author = "W. Chang and A. Proebstl and D. Goswami and M. Zamani and S. Chakraborty",

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Chang, W, Proebstl, A, Goswami, D, Zamani, M & Chakraborty, S 2015, Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles. in Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China., 7272682, Institute of Electrical and Electronics Engineers, Piscataway, pp. 37-42, 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, Hong Kong, China, 19/08/15. https://doi.org/10.1109/CPSNA.2015.16

Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles. / Chang, W.; Proebstl, A.; Goswami, D. et al.
Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China. Piscataway: Institute of Electrical and Electronics Engineers, 2015. p. 37-42 7272682.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AB - Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.

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Chang W, Proebstl A, Goswami D, Zamani M, Chakraborty S. Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles. In Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China. Piscataway: Institute of Electrical and Electronics Engineers. 2015. p. 37-42. 7272682 doi: 10.1109/CPSNA.2015.16

Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles

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