Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles

W. Chang, A. Proebstl, D. Goswami, M. Zamani, S. Chakraborty

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)
1 Downloads (Pure)

Abstract

Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.

Original languageEnglish
Title of host publicationProceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages37-42
Number of pages6
ISBN (Electronic)9781467377850
DOIs
Publication statusPublished - 18 Sep 2015
Event3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015 - Hong Kong, China
Duration: 19 Aug 201521 Aug 2015

Conference

Conference3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015
CountryChina
CityHong Kong
Period19/08/1521/08/15

    Fingerprint

Keywords

  • battery aging
  • cyber-physical systems
  • quality of control
  • Semiconductor aging

Cite this

Chang, W., Proebstl, A., Goswami, D., Zamani, M., & Chakraborty, S. (2015). Reliable CPS design for mitigating semiconductor and battery aging in electric vehicles. In Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015, 19-21 August 2015, Hong Kong, China (pp. 37-42). [7272682] Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CPSNA.2015.16