Reliability modeling for MEMS devices subjected to Multiple dependent competing failure processes

H. Peng, Q. Feng, D.W. Coit

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Original language	English
Title of host publication	Proceedings of the 2009 industrial engineering research conference
Place of Publication	Miami
Publication status	Published - 2009
Event	conference; IERC conference; 2009-05-31; 2009-06-03 - Duration: 31 May 2009 → 3 Jun 2009

Cite this

@inproceedings{56fed1671da8499bbe3b7e8c5bef5d7f,

title = "Reliability modeling for MEMS devices subjected to Multiple dependent competing failure processes",

author = "H. Peng and Q. Feng and D.W. Coit",

year = "2009",

language = "English",

booktitle = "Proceedings of the 2009 industrial engineering research conference",

note = "conference; IERC conference; 2009-05-31; 2009-06-03 ; Conference date: 31-05-2009 Through 03-06-2009",

}

TY - GEN

T1 - Reliability modeling for MEMS devices subjected to Multiple dependent competing failure processes

AU - Peng, H.

AU - Feng, Q.

AU - Coit, D.W.

PY - 2009

Y1 - 2009

M3 - Conference contribution

BT - Proceedings of the 2009 industrial engineering research conference

CY - Miami

T2 - conference; IERC conference; 2009-05-31; 2009-06-03

Y2 - 31 May 2009 through 3 June 2009

ER -