Reliability modeling for MEMS devices subjected to Multiple dependent competing failure processes

H. Peng, Q. Feng, D.W. Coit

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationProceedings of the 2009 industrial engineering research conference
Place of PublicationMiami
Publication statusPublished - 2009
Eventconference; IERC conference; 2009-05-31; 2009-06-03 -
Duration: 31 May 20093 Jun 2009


Conferenceconference; IERC conference; 2009-05-31; 2009-06-03
OtherIERC conference

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