Reliability assessment of potentiometers by 1/f noise analysis

E.P. Vandamme, L.K.J. Vandamme

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis
Pages327-330
Publication statusPublished - 1994
Eventconference; Proc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis, Glasgow, UK, October 1994 -
Duration: 1 Jan 1994 → …

Conference

Conferenceconference; Proc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis, Glasgow, UK, October 1994
Period1/01/94 → …
OtherProc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis, Glasgow, UK, October 1994

Cite this

Vandamme, E. P., & Vandamme, L. K. J. (1994). Reliability assessment of potentiometers by 1/f noise analysis. In Proc. 5th European Symposium of Reliability of Electron Devices, Failure Physics and Analysis (pp. 327-330)