Relative Permittivity Measurements With SIW Resonant Cavities at mm- Wave Frequencies

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In this paper an effective though simple method to accurately characterize dielectric substrate materials at mm-wave frequencies is presented. The method is based on the use of a resonant cavity in SIW technology realized in a substrate made out of the material to characterize. Based on the measured resonant frequency, it is then possible to extract the electrical properties of the material exclusively from the geometry of the cavity. The SIW cavity is fed by two grounded coplanar waveguides to reduce the loading effect of the transmission lines and to avoid errors in the estimations of relative permittivity. The proposed cavity provides a solution for material characterization for emerging 5G-and-beyond applications operating at high frequencies. Measurements have been performed in the frequency range from 10 GHz to 30 GHz, but the design is scalable to lower or higher frequency ranges, if within the possibilities of the manufacturing process of the cavity.

Original languageEnglish
Title of host publicationProceedings of the 52nd European Microwave Conference
PublisherInstitute of Electrical and Electronics Engineers
Number of pages4
ISBN (Electronic)978-2-8748-7069-9
Publication statusPublished - 31 Oct 2022
Event52nd European Microwave Conference (EuMC 2022) - Milano Convention Centre, Milan, Italy
Duration: 25 Sept 202230 Sept 2022
Conference number: 52


Conference52nd European Microwave Conference (EuMC 2022)
Abbreviated titleEuMC 2022


  • material characterization
  • relative permittivity
  • resonant cavity
  • SIW


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