Real-time growth studies on the expanding thermal plasma deposited ZnO films by means of in situ spectroscopic ellipsometry

I. Volintiru, M. Creatore, J.L. Linden, M.C.M. Sanden, van de

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Original languageEnglish
Title of host publicationProceedings 48th Annual Technical Conference - Society of Vacuum Coaters, 23-28 April 2005, Denver, Colorado, USA
Place of PublicationAlbuquerque
PublisherSociety of Vacuum Coaters
Pages534-539
Publication statusPublished - 2005

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Volintiru, I., Creatore, M., Linden, J. L., & Sanden, van de, M. C. M. (2005). Real-time growth studies on the expanding thermal plasma deposited ZnO films by means of in situ spectroscopic ellipsometry. In Proceedings 48th Annual Technical Conference - Society of Vacuum Coaters, 23-28 April 2005, Denver, Colorado, USA (pp. 534-539). Albuquerque: Society of Vacuum Coaters.