Range of slow positrons in metal overlayers on aluminum

B. Nielsen, K.G. Lynn, T.C. Leung, G.J. Kolk, van der, L.J. IJzendoorn, van

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    Abstract

    Polycrystalline Pd and amorphous PdTa films on Al substrates were studied by a variable energy positron beam and by Rutherford backscattering. Since positron diffusion in the overlayers is limited, the range follows directly from the Doppler broadening as a function of incident positron energy. To observe possible effects of positron backscattering, a sandwich of Al/Pd/Al was studied as well. It was found that the mean penetration depth is not described well by (E)=A(µg/cm2)×En(E), if A and n are assumed to be material and energy independent.
    Original languageEnglish
    Pages (from-to)728-730
    Number of pages3
    JournalApplied Physics Letters
    Volume56
    Issue number8
    DOIs
    Publication statusPublished - 1990

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