Abstract
Polycrystalline Pd and amorphous PdTa films on Al substrates were studied by a variable energy positron beam and by Rutherford backscattering. Since positron diffusion in the overlayers is limited, the range follows directly from the Doppler broadening as a function of incident positron energy. To observe possible effects of positron backscattering, a sandwich of Al/Pd/Al was studied as well. It was found that the mean penetration depth is not described well by (E)=A(µg/cm2)×En(E), if A and n are assumed to be material and energy independent.
Original language | English |
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Pages (from-to) | 728-730 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 56 |
Issue number | 8 |
DOIs | |
Publication status | Published - 1990 |