Quantitative structural analysis of binary nanocrystal superlattices by electron tomography

Heiner Friedrich (Corresponding author), Cedric J. Gommes, Karin Overgaag, Johannes D. Meeldijk, Wiel H. Evers, Bart de Nijs, Mark P. Boneschanscher, Petra E. de Jongh, Arie J. Verkleij, Krijn P. de Jong, Alfons van Blaaderen, Daniel Vanmaekelbergh (Corresponding author)

Research output: Contribution to journalArticleAcademicpeer-review

81 Citations (Scopus)
1 Downloads (Pure)


Binary nanocrystal superlattices, that is, ordered structures of two sorts of nanocolloids, hold promise for a series of functional materials with novel collective properties. Here we show that based on electron tomography a comprehensive, quantitative, three-dimensional characterization of these systems down to the single nanocrystal level can be achieved, which is key in understanding the emerging materials properties. On four binary lattices composed of PbSe, CdSe, and Au nanocrystals, we illustrate that ambiguous interpretations based on two-dimensional transmission electron microscopy can be prevented, nanocrystal sizes and superlattice parameters accurately determined, individual crystallographic point and plane defects studied, and the order/disorder at the top and bottom surfaces imaged. Furthermore, our results suggest that superlattice nucleation and growth occurred at the suspension/air interface and that the unit cells of some lattices are anisotropically deformed upon drying.

Original languageEnglish
Pages (from-to)2719-2724
Number of pages6
JournalNano Letters
Issue number7
Publication statusPublished - 8 Jul 2009
Externally publishedYes


Dive into the research topics of 'Quantitative structural analysis of binary nanocrystal superlattices by electron tomography'. Together they form a unique fingerprint.

Cite this