Quantitative nanoscopy : tackling sampling limitations in (S)TEM imaging of polymers and composites

K. Gnanasekaran, R.C.Q. Snel, G. With, de, H. Friedrich

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)
11 Downloads (Pure)


Sampling limitations in electron microscopy questions whether the analysis of a bulk material is representative, especially while analyzing hierarchical morphologies that extend over multiple length scales. We tackled this problem by automatically acquiring a large series of partially overlapping (S)TEM images with sufficient resolution, subsequently stitched together to generate a large-area map using an in-house developed acquisition toolbox (TU/e Acquisition ToolBox) and stitching module (TU/e Stitcher). In addition, we show that quantitative image analysis of the large scale maps provides representative information that can be related to the synthesis and process conditions of hierarchical materials, which moves electron microscopy analysis towards becoming a bulk characterization tool. We demonstrate the power of such an analysis by examining two different multi-phase materials that are structured over multiple length scales.
Original languageEnglish
Pages (from-to)130-139
Number of pages10
Publication statusPublished - 2016

Fingerprint Dive into the research topics of 'Quantitative nanoscopy : tackling sampling limitations in (S)TEM imaging of polymers and composites'. Together they form a unique fingerprint.

  • Equipment

    Center for Multiscale Electron Microscopy (CMEM)

    Heiner Friedrich (Manager), Rick Joosten (Operator), Demi de Moor (Operator), Pauline Schmit (Operator), Ingeborg Schreur - Piet (Operator), Anne Spoelstra (Operator) & Nina Romme - van Moll (Other)

    Materials and Interface Chemistry

    Facility/equipment: Research lab

  • Cite this