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Quantitative EPMA of ultra-light elements : strategies and pitfalls

  • G.F. Bastin
  • , H.J.M. Heijligers

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Abstract

    The electron probe microanal. (EPMA) of B,C, and O using wavelength dispersive techniques requires complicated exptl. procedures. A major phys. problem in the quantification of B, C, N, and O using matrix correction procedures is the uncertainty in the mass absorption coeffs. (mac's). Two different EPMA procedures were used to obtain better consistent mac values. Both methods are based upon the use of a reliable correction program. The first method required the knowledge of the compn. of the specimen, and the measured k-ratios must be compared with values calcd. by the correction program in conjunction with a specific sets of mac's. Increasing discrepancies between measurements and calcns. with increasing accelerating voltage point to inconsistent mac's. A slight disadvantage of this method is that the compn. of the specimen has to be known accurately. In the alternative procedure the relative intensity of emitted radiation was measured as a function of accelerating voltage and subsequently compared with the calcns. made with a good j(rz) correction program, using a variety of mac values. [on SciFinder (R)]
    Original languageEnglish
    Title of host publicationMicrobeam analysis 2000 : proceedings of the second conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9 - 14 July 2000
    EditorsD.B. Williams, Ryuichi Shimizu
    Place of PublicationBristol
    PublisherInstitute of Physics
    Pages423-424
    ISBN (Print)0-7503-0685-8
    Publication statusPublished - 2000
    Event2nd conference of the International Union of Microbeam Analysis Societies (IUMAS-II), 2000 - Kailua-Kona, United States
    Duration: 9 Jul 2000 → 14 Jul 2000

    Publication series

    NameInstitute of Physics Conference Series
    Volume165
    ISSN (Print)0951-3248

    Conference

    Conference2nd conference of the International Union of Microbeam Analysis Societies (IUMAS-II), 2000
    Country/TerritoryUnited States
    CityKailua-Kona
    Period9/07/00 → 14/07/00

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