Quantitative EPMA of ultra-light elements : strategies and pitfalls

G.F. Bastin, H.J.M. Heijligers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

The electron probe microanal. (EPMA) of B,C, and O using wavelength dispersive techniques requires complicated exptl. procedures. A major phys. problem in the quantification of B, C, N, and O using matrix correction procedures is the uncertainty in the mass absorption coeffs. (mac's). Two different EPMA procedures were used to obtain better consistent mac values. Both methods are based upon the use of a reliable correction program. The first method required the knowledge of the compn. of the specimen, and the measured k-ratios must be compared with values calcd. by the correction program in conjunction with a specific sets of mac's. Increasing discrepancies between measurements and calcns. with increasing accelerating voltage point to inconsistent mac's. A slight disadvantage of this method is that the compn. of the specimen has to be known accurately. In the alternative procedure the relative intensity of emitted radiation was measured as a function of accelerating voltage and subsequently compared with the calcns. made with a good j(rz) correction program, using a variety of mac values. [on SciFinder (R)]
Original languageEnglish
Title of host publicationMicrobeam analysis 2000 : proceedings of the second conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9 - 14 July 2000
EditorsD.B. Williams, Ryuichi Shimizu
Place of PublicationBristol
PublisherInstitute of Physics
Pages423-424
ISBN (Print)0-7503-0685-8
Publication statusPublished - 2000
Eventconference; Conference of the International Union of Microbeam Analysis Societies (IUMAS) ; 2 Kailua-Kona, Hawaii, 2000.07.09-14; 2000-07-08; 2000-07-14 -
Duration: 8 Jul 200014 Jul 2000

Publication series

NameInstitute of Physics Conference Series
Volume165
ISSN (Print)0951-3248

Conference

Conferenceconference; Conference of the International Union of Microbeam Analysis Societies (IUMAS) ; 2 Kailua-Kona, Hawaii, 2000.07.09-14; 2000-07-08; 2000-07-14
Period8/07/0014/07/00
OtherConference of the International Union of Microbeam Analysis Societies (IUMAS) ; 2 Kailua-Kona, Hawaii, 2000.07.09-14

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