Quantitative epma of nitrogen : a tricky element in the electron-probe microanalyzer

G.F. Bastin, H.J.M. Heijligers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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Abstract

No abstract.
Original languageEnglish
Title of host publicationProceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada
EditorsG.J. Bailey, J. Bentley, J.A. Small
Place of PublicationSan Francisco
PublisherSan Francisco Press
Pages1622-1623
Publication statusPublished - 1992

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Bastin, G. F., & Heijligers, H. J. M. (1992). Quantitative epma of nitrogen : a tricky element in the electron-probe microanalyzer. In G. J. Bailey, J. Bentley, & J. A. Small (Eds.), Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada (pp. 1622-1623). San Francisco: San Francisco Press.
Bastin, G.F. ; Heijligers, H.J.M. / Quantitative epma of nitrogen : a tricky element in the electron-probe microanalyzer. Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada. editor / G.J. Bailey ; J. Bentley ; J.A. Small. San Francisco : San Francisco Press, 1992. pp. 1622-1623
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Bastin, GF & Heijligers, HJM 1992, Quantitative epma of nitrogen : a tricky element in the electron-probe microanalyzer. in GJ Bailey, J Bentley & JA Small (eds), Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada. San Francisco Press, San Francisco, pp. 1622-1623.

Quantitative epma of nitrogen : a tricky element in the electron-probe microanalyzer. / Bastin, G.F.; Heijligers, H.J.M.

Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada. ed. / G.J. Bailey; J. Bentley; J.A. Small. San Francisco : San Francisco Press, 1992. p. 1622-1623.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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AU - Heijligers, H.J.M.

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BT - Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada

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PB - San Francisco Press

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Bastin GF, Heijligers HJM. Quantitative epma of nitrogen : a tricky element in the electron-probe microanalyzer. In Bailey GJ, Bentley J, Small JA, editors, Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada. San Francisco: San Francisco Press. 1992. p. 1622-1623