Quantitative electron-probe microanalysis of very light elements

G.F. Bastin, H.J.M. Heijligers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationMicrobeam Analysis : Proceedings of the 20th annual conference of the Microbeam Analysis Society
Place of PublicationSan Francisco
PublisherSan Francisco Press
Pages1-6
Publication statusPublished - 1985
Eventconference; The 20th annual conference of the Microbeam Analysis Society // Microbeam Analysis Society , 20 (Louisville,Ky.) : 1985.08.05-09; 1985-08-05; 1985-08-09 -
Duration: 5 Aug 19859 Aug 1985

Conference

Conferenceconference; The 20th annual conference of the Microbeam Analysis Society // Microbeam Analysis Society , 20 (Louisville,Ky.) : 1985.08.05-09; 1985-08-05; 1985-08-09
Period5/08/859/08/85
OtherThe 20th annual conference of the Microbeam Analysis Society // Microbeam Analysis Society , 20 (Louisville,Ky.) : 1985.08.05-09

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