Quantitative Analysis of Electron Tomograms using Auto- and Cross-Correlations

Heiner Friedrich; C.J. Gommes; P.E. Jongh, de; K.P. de Jong

doi:10.1017/S1431927610059428

Quantitative Analysis of Electron Tomograms using Auto- and Cross-Correlations

Heiner Friedrich, C.J. Gommes, P.E. Jongh, de, K.P. de Jong

Physical Chemistry

Research output: Contribution to journal › Conference article › peer-review

Abstract

No abstract available

Original language	English
Pages (from-to)	1850-1851
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	16
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927610059428
Publication status	Published - 1 Aug 2010

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@article{af93067feb9448d395767bbae4a3451e,

title = "Quantitative Analysis of Electron Tomograms using Auto- and Cross-Correlations",

abstract = "No abstract available",

author = "Heiner Friedrich and C.J. Gommes and {Jongh, de}, P.E. and {de Jong}, K.P.",

year = "2010",

month = aug,

day = "1",

doi = "10.1017/S1431927610059428",

language = "English",

volume = "16",

pages = "1850--1851",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S2",

}

TY - JOUR

T1 - Quantitative Analysis of Electron Tomograms using Auto- and Cross-Correlations

AU - Friedrich, Heiner

AU - Gommes, C.J.

AU - Jongh, de, P.E.

AU - de Jong, K.P.

PY - 2010/8/1

Y1 - 2010/8/1

N2 - No abstract available

AB - No abstract available

U2 - 10.1017/S1431927610059428

DO - 10.1017/S1431927610059428

M3 - Conference article

SN - 1431-9276

VL - 16

SP - 1850

EP - 1851

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Quantitative Analysis of Electron Tomograms using Auto- and Cross-Correlations

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