Quantification of Liquid Crystal Concentrations in Periodically Stratified Polymer-Dispersed Liquid Crystal Films by Dynamic Secondary Ion Mass Spectrometry and Multivariate Statistical Analysis

B.K.C. Kjellander, C.W.T. Bulle-Lieuwma, L.J. IJzendoorn, van, A.M. Jong, de, J.W. Niemantsverdriet, D.J. Broer

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Abstract

Liq. crystal (LC) concns. in stratified holog. polymer-dispersed liq. crystal (PDLC) films have been quantified from depth profiles obtained by time-of-flight secondary ion mass spectrometry (SIMS). The volatile nature of the LCs was hindered during SIMS anal. by capping the PDLC samples with poly(vinyl alc.) and cooling to cryogenic temps. It remains difficult to gain quant. results from SIMS anal. due to matrix effects yielding complex SIMS fingerprint spectra. With the multivariate statistical method discriminant function anal. the LC contents in the stratified holog. PDLC films were quantified. The concn. of the LC-rich layers was detd. to be 32.9 +- 3.4 wt % LC, and for the polymer-rich layers it was 28.8 +- 2.7 wt % LC. The low concn. difference was supported by imaging anal. and modeling results. [on SciFinder (R)]
Original languageEnglish
Pages (from-to)10965-10971
JournalJournal of Physical Chemistry C
Volume111
Issue number29
DOIs
Publication statusPublished - 2007

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