Quantification of fluorine density in the outermost atomic layer

R.D. van de Grampel, W. Ming, A. Gildenpfennig, J. Laven, H.H. Brongersma, G. With, de, R. Linde, van der

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

The outermost at. layer of perfluorinated thiol monolayers on gold and poly(tetrafluoroethylene) (PTFE) is analyzed by low-energy ion scattering. Abs. quantification of fluorine d. in this layer was achieved after calibrating the fluorine signal with a freshly cleaved LiF(100) single crystal. The fluorine d. of monolayers of a C8F17-thiol on gold was 1.48 * 1015 F atoms/cm2, whereas for PTFE a value of 1.24 * 1015 F atoms/cm2 was obsd. This difference was explained by the different tilt angles of the thiol on gold and PTFE chains with respect to the surface normal. Both a configurational and a mol. interpretation on the perfluorinated thiol monolayer on gold are given.
Original languageEnglish
Pages (from-to)145-149
JournalLangmuir
Volume20
Issue number1
DOIs
Publication statusPublished - 2004

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Fluorine
Sulfhydryl Compounds
thiols
Gold
fluorine
polytetrafluoroethylene
Polytetrafluoroethylenes
gold
Monolayers
Atoms
ion scattering
calibrating
atoms
Single crystals
Scattering
Ions
single crystals
energy

Cite this

van de Grampel, R. D., Ming, W., Gildenpfennig, A., Laven, J., Brongersma, H. H., With, de, G., & Linde, van der, R. (2004). Quantification of fluorine density in the outermost atomic layer. Langmuir, 20(1), 145-149. https://doi.org/10.1021/la0353071
van de Grampel, R.D. ; Ming, W. ; Gildenpfennig, A. ; Laven, J. ; Brongersma, H.H. ; With, de, G. ; Linde, van der, R. / Quantification of fluorine density in the outermost atomic layer. In: Langmuir. 2004 ; Vol. 20, No. 1. pp. 145-149.
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van de Grampel, RD, Ming, W, Gildenpfennig, A, Laven, J, Brongersma, HH, With, de, G & Linde, van der, R 2004, 'Quantification of fluorine density in the outermost atomic layer', Langmuir, vol. 20, no. 1, pp. 145-149. https://doi.org/10.1021/la0353071

Quantification of fluorine density in the outermost atomic layer. / van de Grampel, R.D.; Ming, W.; Gildenpfennig, A.; Laven, J.; Brongersma, H.H.; With, de, G.; Linde, van der, R.

In: Langmuir, Vol. 20, No. 1, 2004, p. 145-149.

Research output: Contribution to journalArticleAcademicpeer-review

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T1 - Quantification of fluorine density in the outermost atomic layer

AU - van de Grampel, R.D.

AU - Ming, W.

AU - Gildenpfennig, A.

AU - Laven, J.

AU - Brongersma, H.H.

AU - With, de, G.

AU - Linde, van der, R.

PY - 2004

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AB - The outermost at. layer of perfluorinated thiol monolayers on gold and poly(tetrafluoroethylene) (PTFE) is analyzed by low-energy ion scattering. Abs. quantification of fluorine d. in this layer was achieved after calibrating the fluorine signal with a freshly cleaved LiF(100) single crystal. The fluorine d. of monolayers of a C8F17-thiol on gold was 1.48 * 1015 F atoms/cm2, whereas for PTFE a value of 1.24 * 1015 F atoms/cm2 was obsd. This difference was explained by the different tilt angles of the thiol on gold and PTFE chains with respect to the surface normal. Both a configurational and a mol. interpretation on the perfluorinated thiol monolayer on gold are given.

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van de Grampel RD, Ming W, Gildenpfennig A, Laven J, Brongersma HH, With, de G et al. Quantification of fluorine density in the outermost atomic layer. Langmuir. 2004;20(1):145-149. https://doi.org/10.1021/la0353071