Proposal for improving UIE/IEC flickermeter

R. Cai, J.F.G. Cobben, J.M.A. Myrzik, W.L. Kling

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationIEEE Young Researchers Symposium 2006
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Publication statusPublished - 2006
Event3rd IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2006), April 27-28, 2006, Ghent, Belgium - Ghent, Belgium
Duration: 27 Apr 200628 Apr 2006

Conference

Conference3rd IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2006), April 27-28, 2006, Ghent, Belgium
Abbreviated titleYRS 2006
CountryBelgium
CityGhent
Period27/04/0628/04/06
OtherJoint IAS/PELS/PES Benelux Chapter

Cite this

Cai, R., Cobben, J. F. G., Myrzik, J. M. A., & Kling, W. L. (2006). Proposal for improving UIE/IEC flickermeter. In IEEE Young Researchers Symposium 2006 Piscataway: Institute of Electrical and Electronics Engineers.
Cai, R. ; Cobben, J.F.G. ; Myrzik, J.M.A. ; Kling, W.L. / Proposal for improving UIE/IEC flickermeter. IEEE Young Researchers Symposium 2006. Piscataway : Institute of Electrical and Electronics Engineers, 2006.
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year = "2006",
language = "English",
booktitle = "IEEE Young Researchers Symposium 2006",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",

}

Cai, R, Cobben, JFG, Myrzik, JMA & Kling, WL 2006, Proposal for improving UIE/IEC flickermeter. in IEEE Young Researchers Symposium 2006. Institute of Electrical and Electronics Engineers, Piscataway, 3rd IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2006), April 27-28, 2006, Ghent, Belgium, Ghent, Belgium, 27/04/06.

Proposal for improving UIE/IEC flickermeter. / Cai, R.; Cobben, J.F.G.; Myrzik, J.M.A.; Kling, W.L.

IEEE Young Researchers Symposium 2006. Piscataway : Institute of Electrical and Electronics Engineers, 2006.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Proposal for improving UIE/IEC flickermeter

AU - Cai, R.

AU - Cobben, J.F.G.

AU - Myrzik, J.M.A.

AU - Kling, W.L.

PY - 2006

Y1 - 2006

M3 - Conference contribution

BT - IEEE Young Researchers Symposium 2006

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

ER -

Cai R, Cobben JFG, Myrzik JMA, Kling WL. Proposal for improving UIE/IEC flickermeter. In IEEE Young Researchers Symposium 2006. Piscataway: Institute of Electrical and Electronics Engineers. 2006