Proposal for improving UIE/IEC flickermeter

R. Cai, J.F.G. Cobben, J.M.A. Myrzik, W.L. Kling

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationIEEE Young Researchers Symposium 2006
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Publication statusPublished - 2006
Event3rd IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2006), April 27-28, 2006, Ghent, Belgium - Ghent, Belgium
Duration: 27 Apr 200628 Apr 2006

Conference

Conference3rd IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2006), April 27-28, 2006, Ghent, Belgium
Abbreviated titleYRS 2006
CountryBelgium
CityGhent
Period27/04/0628/04/06
OtherJoint IAS/PELS/PES Benelux Chapter

Cite this