Progress report on on-wafer testing of Photonic Integrated Circuits (PICs)

E. Bitincka; R.G. Broeke; M.K. Smit

Progress report on on-wafer testing of Photonic Integrated Circuits (PICs)

E. Bitincka
, R.G. Broeke
, M.K. Smit

Photonic Integration

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

The accurate characterization of photonic integrated circuits is time consuming and is influenced by the alignment tolerance. To overcome these problems we decided to characterize optical properties of the most iniportant Basic Building Blocks (BBB) by means ofelectrical signals.

Original language	English
Title of host publication	Proceedings of the 18th Annual Symposium of the IEEE Photonics Society Benelux Chapter, 25-26 November 2013, Eindhoven, The Netherlands
Editors	X.J.M. Leijtens, D. Pustakhod
Place of Publication	Eindhoven
Publisher	Eindhoven University of Technology
Pages	61-64
ISBN (Print)	978-90-386-3512-5
Publication status	Published - 2013
Event	18th Annual Symposium of the IEEE Photonics Benelux Chapter - Eindhoven, Netherlands Duration: 25 Nov 2013 → 26 Nov 2013 http://www.photonics-benelux.org/symp13/

Conference

Conference	18th Annual Symposium of the IEEE Photonics Benelux Chapter
Country/Territory	Netherlands
City	Eindhoven
Period	25/11/13 → 26/11/13
Internet address	http://www.photonics-benelux.org/symp13/

Cite this

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title = "Progress report on on-wafer testing of Photonic Integrated Circuits (PICs)",

abstract = "The accurate characterization of photonic integrated circuits is time consuming and is influenced by the alignment tolerance. To overcome these problems we decided to characterize optical properties of the most iniportant Basic Building Blocks (BBB) by means ofelectrical signals.",

author = "E. Bitincka and R.G. Broeke and M.K. Smit",

year = "2013",

language = "English",

isbn = "978-90-386-3512-5",

pages = "61--64",

editor = "X.J.M. Leijtens and D. Pustakhod",

booktitle = "Proceedings of the 18th Annual Symposium of the IEEE Photonics Society Benelux Chapter, 25-26 November 2013, Eindhoven, The Netherlands",

publisher = "Eindhoven University of Technology",

note = "18th Annual Symposium of the IEEE Photonics Benelux Chapter ; Conference date: 25-11-2013 Through 26-11-2013",

url = "http://www.photonics-benelux.org/symp13/",

}

Bitincka, E, Broeke, RG & Smit, MK 2013, Progress report on on-wafer testing of Photonic Integrated Circuits (PICs). in XJM Leijtens & D Pustakhod (eds), Proceedings of the 18th Annual Symposium of the IEEE Photonics Society Benelux Chapter, 25-26 November 2013, Eindhoven, The Netherlands. Eindhoven University of Technology, Eindhoven, pp. 61-64, 18th Annual Symposium of the IEEE Photonics Benelux Chapter, Eindhoven, Netherlands, 25/11/13.

Progress report on on-wafer testing of Photonic Integrated Circuits (PICs). / Bitincka, E.; Broeke, R.G.; Smit, M.K.
Proceedings of the 18th Annual Symposium of the IEEE Photonics Society Benelux Chapter, 25-26 November 2013, Eindhoven, The Netherlands. ed. / X.J.M. Leijtens; D. Pustakhod. Eindhoven: Eindhoven University of Technology, 2013. p. 61-64.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Progress report on on-wafer testing of Photonic Integrated Circuits (PICs)

AU - Bitincka, E.

AU - Broeke, R.G.

AU - Smit, M.K.

PY - 2013

Y1 - 2013

N2 - The accurate characterization of photonic integrated circuits is time consuming and is influenced by the alignment tolerance. To overcome these problems we decided to characterize optical properties of the most iniportant Basic Building Blocks (BBB) by means ofelectrical signals.

AB - The accurate characterization of photonic integrated circuits is time consuming and is influenced by the alignment tolerance. To overcome these problems we decided to characterize optical properties of the most iniportant Basic Building Blocks (BBB) by means ofelectrical signals.

M3 - Conference contribution

SN - 978-90-386-3512-5

SP - 61

EP - 64

BT - Proceedings of the 18th Annual Symposium of the IEEE Photonics Society Benelux Chapter, 25-26 November 2013, Eindhoven, The Netherlands

A2 - Leijtens, X.J.M.

A2 - Pustakhod, D.

PB - Eindhoven University of Technology

CY - Eindhoven

T2 - 18th Annual Symposium of the IEEE Photonics Benelux Chapter

Y2 - 25 November 2013 through 26 November 2013

ER -

Progress report on on-wafer testing of Photonic Integrated Circuits (PICs)

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