Product pattern-based camera calibration for microrobotics

R.S. Pieters; P.P. Jonker; H. Nijmeijer

doi:10.1109/IVCNZ.2010.6148839

Product pattern-based camera calibration for microrobotics

R.S. Pieters, P.P. Jonker, H. Nijmeijer

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

Abstract

Traditional macro camera calibration techniques use multiple images at multiple orientations to obtain the camera's internal and external calibration parameters. Microscopic camera calibration differs in this by limiting to only one image at fixed orientation (parallel to the image plane) and requiring a special calibration pattern. We propose a method to use the repetitive product pattern as calibration object. A parametric model of an optical microscope validates this approach by comparing the results from the product pattern with an industrial high-accuracy calibration pattern.

Original language	English
Title of host publication	Proceedings of the 25th International Conference of Image and Vision Computing New Zealand (IVCNZ 2010), 8-9 November 2010, Queenstown, New Zealand
Place of Publication	New Zealand, Queenstown
Pages	6-
DOIs	https://doi.org/10.1109/IVCNZ.2010.6148839
Publication status	Published - 2010

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10.1109/IVCNZ.2010.6148839

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title = "Product pattern-based camera calibration for microrobotics",

abstract = "Traditional macro camera calibration techniques use multiple images at multiple orientations to obtain the camera's internal and external calibration parameters. Microscopic camera calibration differs in this by limiting to only one image at fixed orientation (parallel to the image plane) and requiring a special calibration pattern. We propose a method to use the repetitive product pattern as calibration object. A parametric model of an optical microscope validates this approach by comparing the results from the product pattern with an industrial high-accuracy calibration pattern.",

author = "R.S. Pieters and P.P. Jonker and H. Nijmeijer",

year = "2010",

doi = "10.1109/IVCNZ.2010.6148839",

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Product pattern-based camera calibration for microrobotics. / Pieters, R.S.; Jonker, P.P.; Nijmeijer, H.
Proceedings of the 25th International Conference of Image and Vision Computing New Zealand (IVCNZ 2010), 8-9 November 2010, Queenstown, New Zealand. New Zealand, Queenstown, 2010. p. 6-.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Jonker, P.P.

AU - Nijmeijer, H.

PY - 2010

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N2 - Traditional macro camera calibration techniques use multiple images at multiple orientations to obtain the camera's internal and external calibration parameters. Microscopic camera calibration differs in this by limiting to only one image at fixed orientation (parallel to the image plane) and requiring a special calibration pattern. We propose a method to use the repetitive product pattern as calibration object. A parametric model of an optical microscope validates this approach by comparing the results from the product pattern with an industrial high-accuracy calibration pattern.

AB - Traditional macro camera calibration techniques use multiple images at multiple orientations to obtain the camera's internal and external calibration parameters. Microscopic camera calibration differs in this by limiting to only one image at fixed orientation (parallel to the image plane) and requiring a special calibration pattern. We propose a method to use the repetitive product pattern as calibration object. A parametric model of an optical microscope validates this approach by comparing the results from the product pattern with an industrial high-accuracy calibration pattern.

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DO - 10.1109/IVCNZ.2010.6148839

M3 - Conference contribution

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BT - Proceedings of the 25th International Conference of Image and Vision Computing New Zealand (IVCNZ 2010), 8-9 November 2010, Queenstown, New Zealand

CY - New Zealand, Queenstown

ER -

Product pattern-based camera calibration for microrobotics

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