Abstract
Standard GaAs-based VCSEL structures with doped DBR mirrors are processed into intra-cavity contacted VCSELs with asymmetric current injection to investigate their polarisation behaviour. The processing requires reflectometry measurements during etching of the first and second mesa. The p- and n-contacts are deposited on an AlGaAs layer with the lowest Al-content of the upper and bottom DBR respectively. A dichromate solution was used to etch selectively the higher Al-content layer of the DBRs before depositing the contacts.
| Original language | English |
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| Title of host publication | Proceedings of the 6th annual symposium of the IEEE/LEOS Benelux Chapter, 2 December 2001, Brussels, Belgium |
| Editors | F. Berghmans, H. Thienpont, J. Danckaert, L. Desmet |
| Place of Publication | Brussels, Belgium |
| Publisher | IEEE/LEOS |
| Pages | 113-117 |
| ISBN (Print) | 90-5487247-0 |
| Publication status | Published - 2001 |
| Event | 6th Annual Symposium of the IEEE/LEOS Benelux Chapter - Brussels, Belgium Duration: 3 Dec 2001 → 3 Dec 2001 Conference number: 6 |
Conference
| Conference | 6th Annual Symposium of the IEEE/LEOS Benelux Chapter |
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| Country/Territory | Belgium |
| City | Brussels |
| Period | 3/12/01 → 3/12/01 |