Fingerprint
Dive into the research topics of 'Processing induced defects in submicron active-passive areas for InP-based membranes on silicon (IMOS)'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Processing induced defects in submicron active-passive areas for InP-based membranes on silicon (IMOS)
R. Zhang, J.J.G.M. Tol, van der, P.J.A. Thijs, M.K. Smit
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic
2
Downloads
(Pure)