Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005

D.L. Eager (Editor), C.L. Williamson (Editor), S.C. Borst (Editor), J.C.S. Lui (Editor)

Research output: Book/ReportBook editingProfessional

Original languageEnglish
Place of PublicationNew York
PublisherAssociation for Computing Machinery, Inc
ISBN (Print)1-59593-022-1
Publication statusPublished - 2005

Publication series

NameMeasurement and modeling of computer systems : proceedings of the ... ACM SIGMETRICS conference

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