Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005

D.L. Eager; C.L. Williamson; S.C. Borst; J.C.S. Lui

Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005

D.L. Eager (Editor), C.L. Williamson (Editor), S.C. Borst (Editor), J.C.S. Lui (Editor)

Stochastic Operations Research

Research output: Book/Report › Book editing › Professional

Original language	English
Place of Publication	New York
Publisher	Association for Computing Machinery, Inc
ISBN (Print)	1-59593-022-1
Publication status	Published - 2005

Publication series

Name	Measurement and modeling of computer systems : proceedings of the ... ACM SIGMETRICS conference
Volume	2005

Cite this

Eager, D. L., Williamson, C. L., Borst, S. C., & Lui, J. C. S. (Eds.) (2005). Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005. (Measurement and modeling of computer systems : proceedings of the ... ACM SIGMETRICS conference; Vol. 2005). Association for Computing Machinery, Inc.

Eager, D.L. (Editor) ; Williamson, C.L. (Editor) ; Borst, S.C. (Editor) et al. / Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005. New York : Association for Computing Machinery, Inc, 2005. (Measurement and modeling of computer systems : proceedings of the ... ACM SIGMETRICS conference).

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title = "Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005",

editor = "D.L. Eager and C.L. Williamson and S.C. Borst and J.C.S. Lui",

year = "2005",

language = "English",

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Eager, DL, Williamson, CL, Borst, SC & Lui, JCS (eds) 2005, Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005. Measurement and modeling of computer systems : proceedings of the ... ACM SIGMETRICS conference, vol. 2005, Association for Computing Machinery, Inc, New York.

Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005. / Eager, D.L. (Editor); Williamson, C.L. (Editor); Borst, S.C. (Editor) et al.
New York: Association for Computing Machinery, Inc, 2005. (Measurement and modeling of computer systems : proceedings of the ... ACM SIGMETRICS conference; Vol. 2005).

Research output: Book/Report › Book editing › Professional

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PB - Association for Computing Machinery, Inc

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Eager DL, (ed.), Williamson CL, (ed.), Borst SC, (ed.), Lui JCS, (ed.). Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005. New York: Association for Computing Machinery, Inc, 2005. (Measurement and modeling of computer systems : proceedings of the ... ACM SIGMETRICS conference).

Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Banff, AB, Canada - June 06 - 10, 2005

Publication series

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