Probing Spatial Variation of Electronic Properties at Cu due to a Subsurface Nanoscaled Inhomogeneities

O.A.O. Adam, O. Kurnosikov, H.J.M. Swagten, W.J.M. Jonge, de

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationDutch Scanning Probe Microscopy Meeting; Groningen, Netherlands, the (30 okt - 31 okt 2006)
Publication statusPublished - 2006

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