Probing impurities at the atomic scale in semiconductor structures

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

73 Downloads (Pure)
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Department of Applied Physics
Supervisors/Advisors
  • Koenraad, Paul M., Promotor
  • Bakkers, Erik P.A.M., Promotor
Award date22 Nov 2019
Place of PublicationEindhoven
Publisher
Print ISBNs978-90-386-4902-3
Publication statusPublished - 22 Nov 2019

Bibliographical note

Proefschrift

Promotion : time and place

  • 16.00h, Atlas, room 0.710

Cite this

Plantenga, R. C. (2019). Probing impurities at the atomic scale in semiconductor structures. Eindhoven: Technische Universiteit Eindhoven.
Plantenga, Rianne Carolina. / Probing impurities at the atomic scale in semiconductor structures. Eindhoven : Technische Universiteit Eindhoven, 2019. 166 p.
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title = "Probing impurities at the atomic scale in semiconductor structures",
author = "Plantenga, {Rianne Carolina}",
note = "Proefschrift",
year = "2019",
month = "11",
day = "22",
language = "English",
isbn = "978-90-386-4902-3",
publisher = "Technische Universiteit Eindhoven",
school = "Department of Applied Physics",

}

Plantenga, RC 2019, 'Probing impurities at the atomic scale in semiconductor structures', Doctor of Philosophy, Department of Applied Physics, Eindhoven.

Probing impurities at the atomic scale in semiconductor structures. / Plantenga, Rianne Carolina.

Eindhoven : Technische Universiteit Eindhoven, 2019. 166 p.

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

TY - THES

T1 - Probing impurities at the atomic scale in semiconductor structures

AU - Plantenga, Rianne Carolina

N1 - Proefschrift

PY - 2019/11/22

Y1 - 2019/11/22

M3 - Phd Thesis 1 (Research TU/e / Graduation TU/e)

SN - 978-90-386-4902-3

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -

Plantenga RC. Probing impurities at the atomic scale in semiconductor structures. Eindhoven: Technische Universiteit Eindhoven, 2019. 166 p.