Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis

O.O Sy; J.A.H.M. Vaessen; M.C. Beurden, van; B.L. Michielsen; A.G. Tijhuis

Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis

O.O Sy
, J.A.H.M. Vaessen
, M.C. Beurden, van
, B.L. Michielsen
, A.G. Tijhuis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

A probabilistic characterization of random electromagnetic interactions affected by reso- nances is presented. It hinges on the analysis of the variance and the kurtosis. It is illustrated by the case of a randomly undulating thin wire over a plane.

Original language	English
Title of host publication	7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland
Editors	Janne Roos, Luis R.J. Costa
Place of Publication	Espoo, Finland
Publisher	Helsinki University of Technology
Pages	41-42
ISBN (Print)	978-951-22-9557-9
Publication status	Published - 2008

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Sy, O. O., Vaessen, J. A. H. M., Beurden, van, M. C., Michielsen, B. L., & Tijhuis, A. G. (2008). Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis. In J. Roos, & L. R. J. Costa (Eds.), 7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland (pp. 41-42). Helsinki University of Technology.

Sy, O.O ; Vaessen, J.A.H.M. ; Beurden, van, M.C. et al. / Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis. 7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland. editor / Janne Roos ; Luis R.J. Costa. Espoo, Finland : Helsinki University of Technology, 2008. pp. 41-42

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title = "Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis",

abstract = "A probabilistic characterization of random electromagnetic interactions affected by reso- nances is presented. It hinges on the analysis of the variance and the kurtosis. It is illustrated by the case of a randomly undulating thin wire over a plane.",

author = "O.O Sy and J.A.H.M. Vaessen and \{Beurden, van\}, M.C. and B.L. Michielsen and A.G. Tijhuis",

year = "2008",

language = "English",

isbn = "978-951-22-9557-9",

pages = "41--42",

editor = "Janne Roos and Costa, \{Luis R.J.\}",

booktitle = "7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland",

publisher = "Helsinki University of Technology",

}

Sy, OO, Vaessen, JAHM, Beurden, van, MC, Michielsen, BL & Tijhuis, AG 2008, Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis. in J Roos & LRJ Costa (eds), 7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland. Helsinki University of Technology, Espoo, Finland, pp. 41-42.

Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis. / Sy, O.O; Vaessen, J.A.H.M.; Beurden, van, M.C. et al.
7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland. ed. / Janne Roos; Luis R.J. Costa. Espoo, Finland: Helsinki University of Technology, 2008. p. 41-42.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis

AU - Sy, O.O

AU - Vaessen, J.A.H.M.

AU - Beurden, van, M.C.

AU - Michielsen, B.L.

AU - Tijhuis, A.G.

PY - 2008

Y1 - 2008

N2 - A probabilistic characterization of random electromagnetic interactions affected by reso- nances is presented. It hinges on the analysis of the variance and the kurtosis. It is illustrated by the case of a randomly undulating thin wire over a plane.

AB - A probabilistic characterization of random electromagnetic interactions affected by reso- nances is presented. It hinges on the analysis of the variance and the kurtosis. It is illustrated by the case of a randomly undulating thin wire over a plane.

M3 - Conference contribution

SN - 978-951-22-9557-9

SP - 41

EP - 42

BT - 7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland

A2 - Roos, Janne

A2 - Costa, Luis R.J.

PB - Helsinki University of Technology

CY - Espoo, Finland

ER -

Sy OO, Vaessen JAHM, Beurden, van MC, Michielsen BL, Tijhuis AG. Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis. In Roos J, Costa LRJ, editors, 7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland. Espoo, Finland: Helsinki University of Technology. 2008. p. 41-42

Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis

Abstract

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