Probablistic characterization of resonant EM interactions with thin-wires: variance and kurtosis analysis

O.O Sy, J.A.H.M. Vaessen, M.C. Beurden, van, B.L. Michielsen, A.G. Tijhuis

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

A probabilistic characterization of random electromagnetic interactions affected by reso- nances is presented. It hinges on the analysis of the variance and the kurtosis. It is illustrated by the case of a randomly undulating thin wire over a plane.
Original languageEnglish
Title of host publication7th International Conference on Scientific Computing in Electrical Engineering, SCEE 2008, 28 September - 3 October 2008, Espoo, Finland
EditorsJanne Roos, Luis R.J. Costa
Place of PublicationEspoo, Finland
PublisherHelsinki University of Technology
Pages41-42
ISBN (Print)978-951-22-9557-9
Publication statusPublished - 2008

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