Probability analysis for CMOS floating gate faults

H. Xue, C. Di, J.A.G. Jess

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

27 Citations (Scopus)
Original languageEnglish
Title of host publicationProc. European Design and Test Conference, ED&TC
Pages443-449
Publication statusPublished - 1994
Event1994 European Conference on Design Automation (EDAC)
- Paris, France
Duration: 28 Feb 19943 Mar 1994

Conference

Conference1994 European Conference on Design Automation (EDAC)
CountryFrance
CityParis
Period28/02/943/03/94
OtherEDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design

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