Probability analysis for CMOS floating gate faults

H. Xue, C. Di, J.A.G. Jess

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. European Design and Test Conference, ED&TC
Pages	443-449
Publication status	Published - 1994
Event	1994 European Conference on Design Automation (EDAC) - Paris, France Duration: 28 Feb 1994 → 3 Mar 1994

Conference	1994 European Conference on Design Automation (EDAC)
Country/Territory	France
City	Paris
Period	28/02/94 → 3/03/94
Other	EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design

Cite this

@inproceedings{c5e53aec98594e13bcee4a559e45762a,

title = "Probability analysis for CMOS floating gate faults",

author = "H. Xue and C. Di and J.A.G. Jess",

year = "1994",

language = "English",

pages = "443--449",

booktitle = "Proc. European Design and Test Conference, ED&TC",

note = "1994 European Conference on Design Automation (EDAC)<br/> ; Conference date: 28-02-1994 Through 03-03-1994",

}