Probabilistic study of the coupling between a deterministic field and a stochastic system : application to a thin wire over a PEC ground plane

O.O Sy; J.A.H.M. Vaessen; M.C. Beurden, van; A.G. Tijhuis; B.L. Michielsen

Probabilistic study of the coupling between a deterministic field and a stochastic system : application to a thin wire over a PEC ground plane

O.O Sy, J.A.H.M. Vaessen, M.C. Beurden, van, A.G. Tijhuis, B.L. Michielsen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

A stochastic method is presented to statistically characterize electromagnetic interactions affected by uncertainties. A stochastically undulating thin-wire over a perfectly conducting ground plane is studied. The aim of this paper is to determine the statistical moments of the voltage induced at the port of this wire by a deterministic incident field. A probabilistic definition of the average and the variance is used. Two methods have been developed to compute these statistical moments: a quadrature method and a perturbation approach.

Original language	English
Title of host publication	Proceedings of the EMC Europe Workshop 2007, 14-16 June 2007, Paris, France
Place of Publication	s.n.
Publisher	s.n.
Pages	1-5
Publication status	Published - 2007

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title = "Probabilistic study of the coupling between a deterministic field and a stochastic system : application to a thin wire over a PEC ground plane",

abstract = "A stochastic method is presented to statistically characterize electromagnetic interactions affected by uncertainties. A stochastically undulating thin-wire over a perfectly conducting ground plane is studied. The aim of this paper is to determine the statistical moments of the voltage induced at the port of this wire by a deterministic incident field. A probabilistic definition of the average and the variance is used. Two methods have been developed to compute these statistical moments: a quadrature method and a perturbation approach.",

author = "O.O Sy and J.A.H.M. Vaessen and {Beurden, van}, M.C. and A.G. Tijhuis and B.L. Michielsen",

year = "2007",

language = "English",

pages = "1--5",

booktitle = "Proceedings of the EMC Europe Workshop 2007, 14-16 June 2007, Paris, France",

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Probabilistic study of the coupling between a deterministic field and a stochastic system : application to a thin wire over a PEC ground plane. / Sy, O.O; Vaessen, J.A.H.M.; Beurden, van, M.C. et al.
Proceedings of the EMC Europe Workshop 2007, 14-16 June 2007, Paris, France. s.n.: s.n., 2007. p. 1-5.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Probabilistic study of the coupling between a deterministic field and a stochastic system : application to a thin wire over a PEC ground plane

AU - Sy, O.O

AU - Vaessen, J.A.H.M.

AU - Beurden, van, M.C.

AU - Tijhuis, A.G.

AU - Michielsen, B.L.

PY - 2007

Y1 - 2007

N2 - A stochastic method is presented to statistically characterize electromagnetic interactions affected by uncertainties. A stochastically undulating thin-wire over a perfectly conducting ground plane is studied. The aim of this paper is to determine the statistical moments of the voltage induced at the port of this wire by a deterministic incident field. A probabilistic definition of the average and the variance is used. Two methods have been developed to compute these statistical moments: a quadrature method and a perturbation approach.

AB - A stochastic method is presented to statistically characterize electromagnetic interactions affected by uncertainties. A stochastically undulating thin-wire over a perfectly conducting ground plane is studied. The aim of this paper is to determine the statistical moments of the voltage induced at the port of this wire by a deterministic incident field. A probabilistic definition of the average and the variance is used. Two methods have been developed to compute these statistical moments: a quadrature method and a perturbation approach.

M3 - Conference contribution

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EP - 5

BT - Proceedings of the EMC Europe Workshop 2007, 14-16 June 2007, Paris, France

PB - s.n.

CY - s.n.

ER -

Probabilistic study of the coupling between a deterministic field and a stochastic system : application to a thin wire over a PEC ground plane

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