Abstract
A probabilistic approach is presented to perform uncertainty quantification in electromagnetic interaction problems. The aim is to determine the statistical moments of the interaction parameters of interest such as, for example, the voltage induced at the port of a device by an incident field. Several methods to evaluate these moments are analyzed as well as methods to infer or approximate the probability distribution of the interaction parameter from its statistical moments.
Original language | English |
---|---|
Title of host publication | Progress in Electromagnetics Research Symposium, PIERS 2008, 2-6 July 2008, Cambridge |
Editors | J.A. Kong |
Place of Publication | Cambridge, USA |
Publisher | The Electromagnetics Academy |
Pages | 624-624 |
ISBN (Print) | 978-1-934142-05-9 |
Publication status | Published - 2008 |