Preventing damage and redeposition during focused ion beam milling: the “umbrella” method

T. Vermeij, E. Plancher, C.C. Tasan

Research output: Contribution to journal › Article › Academic › peer-review

23 Citations (Scopus)

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2017

A masking technique to perform high accuracy diffraction experiments on FIB-machined specimens
Vermeij, T., Plancher, E. & Tasan, C. C., 1 Apr 2017.
Research output: Contribution to conference › Poster

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22 Downloads (Pure)