Preparation of ZrO2 on flat, conducting SiO2/Si(100) model supports by wet chemical techniques : X-ray photoelectron spectroscopy and Auger depth profiling

L.M. Eshelman, A.M. Jong, de, J.W. Niemantsverdriet

Research output: Contribution to journalArticlepeer-review

27 Citations (Scopus)
128 Downloads (Pure)
Original languageEnglish
Pages (from-to)201-209
JournalCatalysis Letters
Volume10
Issue number3-4
DOIs
Publication statusPublished - 1991

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