Abstract
Correct functionality of semiconductor devices depends on the overlay performance between device layers. Future smaller device features consequently require more accurate overlay metrology tools. In this paper we present a large dynamic range AFM overlay tool to directly measure marker-to-feature distances, and focus on the controller design of the large stroke 6-DoF hexapod motion stage which is at the heart of this tool. The stage is open-loop unstable due to magnetic gravity compensation, which calls for an initial model-based MIMO controller design, which is based on a finite-element modal analysis, geometric decoupling and SISO loopshaping. This controller is successfully validated in experiments; further controller improvements after closed-loop system identification yield a closed-loop position error of just 1 nm RMS.
Original language | English |
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Title of host publication | 1st Annual IEEE Conference on Control Technology and Applications, CCTA 2017 |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 726-731 |
Number of pages | 6 |
Volume | 2017-January |
ISBN (Electronic) | 978-1-5090-2182-6 |
ISBN (Print) | 978-1-5090-2183-3 |
DOIs | |
Publication status | Published - Aug 2017 |
Event | 1st IEEE Conference on Control Technology and Applications, CCTA 2017 - The Mauna Lani Bay Hotel and Bungalows, Kohala Coast, United States Duration: 27 Aug 2017 → 30 Aug 2017 Conference number: 1 |
Conference
Conference | 1st IEEE Conference on Control Technology and Applications, CCTA 2017 |
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Abbreviated title | CCTA 2017 |
Country/Territory | United States |
City | Kohala Coast |
Period | 27/08/17 → 30/08/17 |