Prediction of crack growth in IC passivation layers

Y.T. He, G.Q. Zhang, R. Silfhout, W.D. Driel, van, M. Gils, van

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of the conference EuroSimE 2003, 4th international conference on thermal and mechanical simulation and experiments in microelectronics and microsystems : Aix-en-Provence, France, March 30 - April 2, 2003 /
EditorsL.J. Ernst
Pages323-328
Publication statusPublished - 2003

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