Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry

O. Muraza; E.V. Rebrov; M. Creatore; W. Keuning; W.M.M. Kessels; M.H.J.M. Croon, de; M.C.M. Sanden, van de; J.C. Schouten

Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry

O. Muraza, E.V. Rebrov, M. Creatore, W. Keuning, W.M.M. Kessels, M.H.J.M. Croon, de, M.C.M. Sanden, van de, J.C. Schouten

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Original language	English
Title of host publication	Book of Abstracts Netherlands' Catalysis and Chemistry Conference
Place of Publication	Netherlands, Noordwijkerhout
Pages	P104,-page 256
Publication status	Published - 2007

Cite this

Muraza, O., Rebrov, E. V., Creatore, M., Keuning, W., Kessels, W. M. M., Croon, de, M. H. J. M., ... Schouten, J. C. (2007). Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry. In Book of Abstracts Netherlands' Catalysis and Chemistry Conference (pp. P104,-page 256). Netherlands, Noordwijkerhout.

Muraza, O. ; Rebrov, E.V. ; Creatore, M. ; Keuning, W. ; Kessels, W.M.M. ; Croon, de, M.H.J.M. ; Sanden, van de, M.C.M. ; Schouten, J.C. / Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry. Book of Abstracts Netherlands' Catalysis and Chemistry Conference. Netherlands, Noordwijkerhout, 2007. pp. P104,-page 256

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title = "Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry",

author = "O. Muraza and E.V. Rebrov and M. Creatore and W. Keuning and W.M.M. Kessels and {Croon, de}, M.H.J.M. and {Sanden, van de}, M.C.M. and J.C. Schouten",

year = "2007",

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pages = "P104,--page 256",

booktitle = "Book of Abstracts Netherlands' Catalysis and Chemistry Conference",

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Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry. / Muraza, O.; Rebrov, E.V.; Creatore, M.; Keuning, W.; Kessels, W.M.M.; Croon, de, M.H.J.M.; Sanden, van de, M.C.M.; Schouten, J.C.

Book of Abstracts Netherlands' Catalysis and Chemistry Conference. Netherlands, Noordwijkerhout, 2007. p. P104,-page 256.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry

AU - Muraza, O.

AU - Rebrov, E.V.

AU - Creatore, M.

AU - Keuning, W.

AU - Kessels, W.M.M.

AU - Croon, de, M.H.J.M.

AU - Sanden, van de, M.C.M.

AU - Schouten, J.C.

PY - 2007

Y1 - 2007

M3 - Conference contribution

SP - P104,-page 256

BT - Book of Abstracts Netherlands' Catalysis and Chemistry Conference

CY - Netherlands, Noordwijkerhout

ER -