Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry

O. Muraza, E.V. Rebrov, M. Creatore, W. Keuning, W.M.M. Kessels, M.H.J.M. Croon, de, M.C.M. Sanden, van de, J.C. Schouten

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationBook of Abstracts Netherlands' Catalysis and Chemistry Conference
Place of PublicationNetherlands, Noordwijkerhout
PagesP104,-page 256
Publication statusPublished - 2007

Cite this

Muraza, O., Rebrov, E. V., Creatore, M., Keuning, W., Kessels, W. M. M., Croon, de, M. H. J. M., ... Schouten, J. C. (2007). Pore structure characterization of mesi-SiO2 coatings on glass and silicon substrates by ellipsometric porosimetry. In Book of Abstracts Netherlands' Catalysis and Chemistry Conference (pp. P104,-page 256). Netherlands, Noordwijkerhout.