Abstract
Excitation dependent optical anisotropy in InAs/GaAs quantum dots is studied by means of timeresolved differential reflection spectroscopy, probing the linear polarization eigenstates. The measured dependence of the bleaching is due to linear dichroism. A dichroism of 1.3 is observed, which is determined by strain.
| Original language | English |
|---|---|
| Title of host publication | Proc. 7th Ann. Worksh. STW SAFE on semiconductor advances for future electronics |
| Pages | 682-685 |
| Publication status | Published - 2004 |
| Event | conference; 7th Ann. Worksh. STW SAFE on semiconductor advances for future electronics - Duration: 1 Jan 2004 → … |
Conference
| Conference | conference; 7th Ann. Worksh. STW SAFE on semiconductor advances for future electronics |
|---|---|
| Period | 1/01/04 → … |
| Other | 7th Ann. Worksh. STW SAFE on semiconductor advances for future electronics |