Abstract
Superconducting through silicon vias are emerging as a key interconnect technology to realise a scalable superconducting quantum computing platform. Integration of semiconductor technology into quantum devices is becoming more common whilst quantum devices are taking advantage of novel combinations of plasma processes and materials to realise more qubits and denser integration. In this letter, plasma processes for fabrication of superconducting niobium nitride TSVs have been developed by means of deep silicon etching, plasma polishing and atomic layer deposition. Key steps were experimentally investigated for their impact on etching and deposition results. The underlying mechanisms have been analysed to optimise the whole process flow. Sidewall topography significantly influenced conformality of niobium nitride deposition into deep features. As a result, high-quality vertical superconducting through silicon vias were obtained with a transition temperature of 10.7 K.
| Original language | English |
|---|---|
| Article number | 10813412 |
| Pages (from-to) | 175-178 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 46 |
| Issue number | 2 |
| Early online date | 24 Dec 2024 |
| DOIs | |
| Publication status | Published - Feb 2025 |
Funding
The work of Ciaran T. Lennon was supported in part by the Centre for Doctoral Training in Intelligent Sensing and Measurement under Grant EP/L016753/1 and in part by the Oxford Instruments Plasma Technology. The work of Robert H. Hadfield was supported by U.K. National Quantum Technology Program under Project EP/T00097X/1, Project EP/T0001011/1, Project EP/S026429/1, Project EP/W032627/1, and Project ST/T005920/1.
Keywords
- atomic layer deposition
- deep silicon etch
- niobium nitride
- superconducting
- through silicon via
- Deep silicon etch
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