Picosecond time-resolved bleaching dynamics of self-assembled quantum dots

E.W. Bogaart, J.E.M. Haverkort, T. Mano, R. Nötzel, J.H. Wolter, P. Lever, H.H. Tan, C. Jagadish

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Picosecond bleaching dynamics of vertically stacked self-assembled quantum dots is investigated by means of time-resolved pump-probe differential reflection spectroscopy at room temperature. This allows us to study the dynamics of the pump generated carriers within the quantum dots. We observe that the absorption spectrum is shifted over 12 meV with respect to the photoluminescence spectrum. From the time-resolved measurements we detect that the carrier lifetime within the dots strongly depends on the energy within the absorption spectrum.
Original languageEnglish
Title of host publicationNanotechnology 2003, IEEE-Nano 200, 3rd Conf., August 12-14 2003, San Francisco, U.S.A.
Place of PublicationSan Francisco, U.S.A.
PublisherInstitute of Electrical and Electronics Engineers
Pages663-666
ISBN (Print)0-7803-7976-4
DOIs
Publication statusPublished - 2003
Eventconference; Nanotechnology 2003, IEEE-nano 2003, 3rd conf. San Francisco, USA; 2003-08-12; 2003-08-14 -
Duration: 12 Aug 200314 Aug 2003

Publication series

NameProceedings of the IEEE
Volume2
ISSN (Print)0018-9219

Conference

Conferenceconference; Nanotechnology 2003, IEEE-nano 2003, 3rd conf. San Francisco, USA; 2003-08-12; 2003-08-14
Period12/08/0314/08/03
OtherNanotechnology 2003, IEEE-nano 2003, 3rd conf. San Francisco, USA

Fingerprint

bleaching
quantum dots
pumps
absorption spectra
carrier lifetime
time measurement
photoluminescence
probes
room temperature
spectroscopy
energy

Cite this

Bogaart, E. W., Haverkort, J. E. M., Mano, T., Nötzel, R., Wolter, J. H., Lever, P., ... Jagadish, C. (2003). Picosecond time-resolved bleaching dynamics of self-assembled quantum dots. In Nanotechnology 2003, IEEE-Nano 200, 3rd Conf., August 12-14 2003, San Francisco, U.S.A. (pp. 663-666). (Proceedings of the IEEE; Vol. 2). San Francisco, U.S.A.: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/NANO.2003.1230999
Bogaart, E.W. ; Haverkort, J.E.M. ; Mano, T. ; Nötzel, R. ; Wolter, J.H. ; Lever, P. ; Tan, H.H. ; Jagadish, C. / Picosecond time-resolved bleaching dynamics of self-assembled quantum dots. Nanotechnology 2003, IEEE-Nano 200, 3rd Conf., August 12-14 2003, San Francisco, U.S.A.. San Francisco, U.S.A. : Institute of Electrical and Electronics Engineers, 2003. pp. 663-666 (Proceedings of the IEEE).
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abstract = "Picosecond bleaching dynamics of vertically stacked self-assembled quantum dots is investigated by means of time-resolved pump-probe differential reflection spectroscopy at room temperature. This allows us to study the dynamics of the pump generated carriers within the quantum dots. We observe that the absorption spectrum is shifted over 12 meV with respect to the photoluminescence spectrum. From the time-resolved measurements we detect that the carrier lifetime within the dots strongly depends on the energy within the absorption spectrum.",
author = "E.W. Bogaart and J.E.M. Haverkort and T. Mano and R. N{\"o}tzel and J.H. Wolter and P. Lever and H.H. Tan and C. Jagadish",
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Bogaart, EW, Haverkort, JEM, Mano, T, Nötzel, R, Wolter, JH, Lever, P, Tan, HH & Jagadish, C 2003, Picosecond time-resolved bleaching dynamics of self-assembled quantum dots. in Nanotechnology 2003, IEEE-Nano 200, 3rd Conf., August 12-14 2003, San Francisco, U.S.A.. Proceedings of the IEEE, vol. 2, Institute of Electrical and Electronics Engineers, San Francisco, U.S.A., pp. 663-666, conference; Nanotechnology 2003, IEEE-nano 2003, 3rd conf. San Francisco, USA; 2003-08-12; 2003-08-14, 12/08/03. https://doi.org/10.1109/NANO.2003.1230999

Picosecond time-resolved bleaching dynamics of self-assembled quantum dots. / Bogaart, E.W.; Haverkort, J.E.M.; Mano, T.; Nötzel, R.; Wolter, J.H.; Lever, P.; Tan, H.H.; Jagadish, C.

Nanotechnology 2003, IEEE-Nano 200, 3rd Conf., August 12-14 2003, San Francisco, U.S.A.. San Francisco, U.S.A. : Institute of Electrical and Electronics Engineers, 2003. p. 663-666 (Proceedings of the IEEE; Vol. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Picosecond time-resolved bleaching dynamics of self-assembled quantum dots

AU - Bogaart, E.W.

AU - Haverkort, J.E.M.

AU - Mano, T.

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AU - Wolter, J.H.

AU - Lever, P.

AU - Tan, H.H.

AU - Jagadish, C.

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N2 - Picosecond bleaching dynamics of vertically stacked self-assembled quantum dots is investigated by means of time-resolved pump-probe differential reflection spectroscopy at room temperature. This allows us to study the dynamics of the pump generated carriers within the quantum dots. We observe that the absorption spectrum is shifted over 12 meV with respect to the photoluminescence spectrum. From the time-resolved measurements we detect that the carrier lifetime within the dots strongly depends on the energy within the absorption spectrum.

AB - Picosecond bleaching dynamics of vertically stacked self-assembled quantum dots is investigated by means of time-resolved pump-probe differential reflection spectroscopy at room temperature. This allows us to study the dynamics of the pump generated carriers within the quantum dots. We observe that the absorption spectrum is shifted over 12 meV with respect to the photoluminescence spectrum. From the time-resolved measurements we detect that the carrier lifetime within the dots strongly depends on the energy within the absorption spectrum.

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M3 - Conference contribution

SN - 0-7803-7976-4

T3 - Proceedings of the IEEE

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BT - Nanotechnology 2003, IEEE-Nano 200, 3rd Conf., August 12-14 2003, San Francisco, U.S.A.

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Bogaart EW, Haverkort JEM, Mano T, Nötzel R, Wolter JH, Lever P et al. Picosecond time-resolved bleaching dynamics of self-assembled quantum dots. In Nanotechnology 2003, IEEE-Nano 200, 3rd Conf., August 12-14 2003, San Francisco, U.S.A.. San Francisco, U.S.A.: Institute of Electrical and Electronics Engineers. 2003. p. 663-666. (Proceedings of the IEEE). https://doi.org/10.1109/NANO.2003.1230999