Performance degradation of integrated optical modulators due to electrical crosstalk

W. Yao, G. Gilardi, M.K. Smit, M.J. Wale

Research output: Contribution to journalArticleAcademicpeer-review

18 Citations (Scopus)
200 Downloads (Pure)

Abstract

In this paper, we investigate electrical crosstalk in integrated Mach-Zehnder modulator arrays based on n-doped InP substrate and show that it can be the cause for transmitter performance degradations. In particular, a common ground return path between adjacent modulators can cause high coupling noise up to -20 dB which leads to system power penalties of more than 10 dB at 10 Gb/s OOK modulation. Furthermore, we demonstrate that electrical crosstalk is significantly reduced in the absence of the shared ground and that it varies with modulator separation distance. Experimental results are shown that indicate a crosstalk tolerance of -40 dB for 1 dB power penalty at 10 Gb/s.
Original languageEnglish
Pages (from-to)3080 - 3086
Number of pages7
JournalJournal of Lightwave Technology
Volume34
Issue number13
DOIs
Publication statusPublished - 1 Jul 2016

Fingerprint

Dive into the research topics of 'Performance degradation of integrated optical modulators due to electrical crosstalk'. Together they form a unique fingerprint.

Cite this