Patterning Ultra-High Bit Densities by Large-Area e-Beam Lithography

C.G.C.H.M. Fabrie

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationNanoNed MicroNed Symposium II; Eindhoven, Netherlands, the (16 nov - 17 nov 2006)
Publication statusPublished - 2006

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