Particle morphology from XPS data : design and implementation of a quantification procedure for nanoscale metal particles

J.F.C.M. Reijerse, Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Fysische instrumentatie

Research output: Thesis › EngD Thesis

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution
Supervisors/Advisors	Roosenbrand, A.G., Supervisor Brongersma, H.H., Supervisor
Award date	1 Jan 1995
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Print ISBNs	90-5282-619-6
Publication status	Published - 1995

Eindverslag

Cite this

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title = "Particle morphology from XPS data : design and implementation of a quantification procedure for nanoscale metal particles",

author = "J.F.C.M. Reijerse and \{Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Fysische instrumentatie\}",

note = "Eindverslag",

year = "1995",

language = "English",

isbn = "90-5282-619-6",

publisher = "Technische Universiteit Eindhoven",

type = "EngD Thesis",

}

TY - THES

T1 - Particle morphology from XPS data : design and implementation of a quantification procedure for nanoscale metal particles

AU - Reijerse, J.F.C.M.

AU - Technische Universiteit Eindhoven (TUE). Stan Ackermans Instituut. Fysische instrumentatie

N1 - Eindverslag

PY - 1995

Y1 - 1995

M3 - EngD Thesis

SN - 90-5282-619-6

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -