Participation: the key to intelligent manufacturing improvement

P. Vink; F.M. Eijnatten, van; R.J. van den Berg

Participation: the key to intelligent manufacturing improvement

P. Vink, F.M. Eijnatten, van, R.J. van den Berg

Human Performance Management

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings 20th International Conference on Conceptual Modeling ER 2001, 27-29 November 2001, Yokohama, Japan
Editors	H. Arisawa
Place of Publication	Yokohama, Japan
Publisher	Yokohama National University
Pages	1-7
Publication status	Published - 2001

Cite this

@inproceedings{8da0eaf960c04b7fbb8771a1cc5ad4a5,

title = "Participation: the key to intelligent manufacturing improvement",

author = "P. Vink and {Eijnatten, van}, F.M. and {van den Berg}, R.J.",

year = "2001",

language = "English",

pages = "1--7",

editor = "H. Arisawa",

booktitle = "Proceedings 20th International Conference on Conceptual Modeling ER 2001, 27-29 November 2001, Yokohama, Japan",

publisher = "Yokohama National University",

}

Participation: the key to intelligent manufacturing improvement. / Vink, P.; Eijnatten, van, F.M.; van den Berg, R.J.
Proceedings 20th International Conference on Conceptual Modeling ER 2001, 27-29 November 2001, Yokohama, Japan. ed. / H. Arisawa. Yokohama, Japan: Yokohama National University, 2001. p. 1-7.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Participation: the key to intelligent manufacturing improvement

AU - Vink, P.

AU - Eijnatten, van, F.M.

AU - van den Berg, R.J.

PY - 2001

Y1 - 2001

M3 - Conference contribution

SP - 1

EP - 7

BT - Proceedings 20th International Conference on Conceptual Modeling ER 2001, 27-29 November 2001, Yokohama, Japan

A2 - Arisawa, H.

PB - Yokohama National University

CY - Yokohama, Japan

ER -