Participation: the key to intelligent manufacturing improvement

P. Vink, F.M. Eijnatten, van, R.J. van den Berg

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings 20th International Conference on Conceptual Modeling ER 2001, 27-29 November 2001, Yokohama, Japan
EditorsH. Arisawa
Place of PublicationYokohama, Japan
PublisherYokohama National University
Publication statusPublished - 2001

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