Outlier detection to identify artefacts in EEG signals

P.J.M. Cluitmans; M. Velde, van de

Outlier detection to identify artefacts in EEG signals

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, CD-ROM, paper Th-G206-4
Publisher	IEEE Engineering in Medicine and Biology Society
Publication status	Published - 2000
Event	22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2000 - Chicago, United States Duration: 23 Jul 2000 → 28 Jul 2000 Conference number: 22

Conference

Conference	22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2000
Abbreviated title	EMBC 2000
Country/Territory	United States
City	Chicago
Period	23/07/00 → 28/07/00

Cite this

@inproceedings{e48d794b2ac74db0ba0b7dfab79bce4f,

title = "Outlier detection to identify artefacts in EEG signals",

author = "P.J.M. Cluitmans and {Velde, van de}, M.",

year = "2000",

language = "English",

booktitle = "Proc. 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, CD-ROM, paper Th-G206-4",

publisher = "IEEE Engineering in Medicine and Biology Society",

note = "22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2000, EMBC 2000 ; Conference date: 23-07-2000 Through 28-07-2000",

}

Cluitmans, PJM & Velde, van de, M 2000, Outlier detection to identify artefacts in EEG signals. in Proc. 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, CD-ROM, paper Th-G206-4. IEEE Engineering in Medicine and Biology Society, 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2000, Chicago, Illinois, United States, 23/07/00.

Outlier detection to identify artefacts in EEG signals. / Cluitmans, P.J.M.; Velde, van de, M.
Proc. 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, CD-ROM, paper Th-G206-4. IEEE Engineering in Medicine and Biology Society, 2000.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Outlier detection to identify artefacts in EEG signals

AU - Cluitmans, P.J.M.

AU - Velde, van de, M.

N1 - Conference code: 22

PY - 2000

Y1 - 2000

M3 - Conference contribution

BT - Proc. 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, CD-ROM, paper Th-G206-4

PB - IEEE Engineering in Medicine and Biology Society

T2 - 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2000

Y2 - 23 July 2000 through 28 July 2000

ER -