Outlier detection to identify artefacts in EEG signals

P.J.M. Cluitmans, M. Velde, van de

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publicationProc. 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, CD-ROM, paper Th-G206-4
PublisherIEEE Engineering in Medicine and Biology Society
Publication statusPublished - 2000
Event22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC 2000) - Chicago, United States
Duration: 23 Jul 200028 Jul 2000
Conference number: 22

Conference

Conference22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC 2000)
Abbreviated titleEMBC 2000
Country/TerritoryUnited States
CityChicago
Period23/07/0028/07/00

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