Outlier detection and localisation with wavelet based multifractal formalism

Z.R. Struzik, A.P.J.M. Siebes

    Research output: Book/ReportReportAcademic

    Original languageEnglish
    Place of PublicationAmsterdam
    PublisherCentrum voor Wiskunde en Informatica
    Publication statusPublished - 2000

    Publication series

    NameCWI report. INS-R : information systems
    Volume0008
    ISSN (Print)1386-3681

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