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Oscillatory interlayer exchange coupling with the Cu cap layer thickness in Co/Cu/Co/Cu(100)
J.J. de Vries, A.A.P. Schudelaro, R. Jungblut, P.J.H. Bloemen, A. Reinders, J. Kohlhepp, R. Coehoorn, W.J.M. de Jonge
Research output: Contribution to journal › Article › Academic › peer-review
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