Oscillatory interlayer exchange coupling with the Cu cap layer thickness in Co/Cu/Co/Cu(100)

J.J. de Vries, A.A.P. Schudelaro, R. Jungblut, P.J.H. Bloemen, A. Reinders, J. Kohlhepp, R. Coehoorn, W.J.M. de Jonge

Research output: Contribution to journalArticleAcademicpeer-review

56 Citations (Scopus)
1 Downloads (Pure)

Abstract

An oscillatory dependence of the strength of the antiferromagnetic exchange coupling on the cap layer thickness has been observed in an epitaxial Co/Cu/Co/Cu(100) sample with a wedge-shaped Cu interlayer and cap layer. The result is consistent with a single long oscillation period stemming from the extremal spanning vector of the Cu (cap layer) Fermi surface along the X line. The absence of a short period oscillation is understood from the confinement of the corresponding electron states to the spacer. A quantitative comparison with Bruno's model is made.

Original languageEnglish
Pages (from-to)4306-4309
Number of pages4
JournalPhysical Review Letters
Volume75
Issue number23
DOIs
Publication statusPublished - 1 Jan 1995

Fingerprint

Dive into the research topics of 'Oscillatory interlayer exchange coupling with the Cu cap layer thickness in Co/Cu/Co/Cu(100)'. Together they form a unique fingerprint.

Cite this