TY - JOUR
T1 - Oscillatory behaviour of the interlayer coupling with the thickness of the Cu cap layer in Co/Cu(100)
AU - de Vries, J.J.
AU - Schudelaro, A.A.P.
AU - Jungblut, R.
AU - de Jonge, W.J.M.
PY - 1996/1/1
Y1 - 1996/1/1
N2 - The dependence of the exchange coupling on the thickness of the Cu cap layer in a double wedged MBE grown Co/Cu(100) sample has been studied. The strength of four antiferromagnetic maxima oscillates with the cap layer thickness, consistent with Bruno's reflection model. From this model the relative phases of the oscillations can be explained.
AB - The dependence of the exchange coupling on the thickness of the Cu cap layer in a double wedged MBE grown Co/Cu(100) sample has been studied. The strength of four antiferromagnetic maxima oscillates with the cap layer thickness, consistent with Bruno's reflection model. From this model the relative phases of the oscillations can be explained.
UR - http://www.scopus.com/inward/record.url?scp=0030124627&partnerID=8YFLogxK
U2 - 10.1016/0304-8853(95)00859-4
DO - 10.1016/0304-8853(95)00859-4
M3 - Conference article
AN - SCOPUS:0030124627
SN - 0304-8853
VL - 156
SP - 257
EP - 258
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
IS - 1-3
T2 - 1995 2nd International Symposium on Metallic Multilayers, MML
Y2 - 11 September 1995 through 14 September 1995
ER -